Comprehensive technical knowledge base covering 12 GSMA eSIM specifications. 84+ articles on Remote SIM Provisioning — SGP.02, SGP.22, SGP.32, SGP.41, SGP.29, SGP.23, SGP.25, SGP.26 and more.
You’re testing a tiny computer chip the size of a grain of rice. You can’t plug a keyboard into it. You can’t connect a monitor. All you have are five tiny metal contact pads: and a very precise testing machine that sends electrical signals and measures the responses.
This is the world of eUICC test architecture : where special card readers, USB probes, and five different simulator programs work together to poke and prod every corner of the chip.
The chip can be tested in two physical forms:
| Test Setup | How It Connects | Used For |
|---|---|---|
| TE_eUICC | Metal contacts via a PC/SC card reader | Standard removable chips (like Java Cards) |
| TE_Integrated eUICC | USB CCID test cable in “card reader mode” | Chips buried inside phone processors |
For the integrated chips, it’s actually clever: the chip pretends to be a smart card reader over USB! The test tool plugs in and talks to it as if it were a card reader with a chip inserted.
Since ONLY the chip is real, five different simulator programs pretend to be everyone else:
| Simulator | Role | What It Sends |
|---|---|---|
| S_Device | Phone/modem | ISO 7816-4 APDU commands: the same electrical signals a real phone sends |
| S_LPAd | Phone Assistant | ES10 commands wrapped in STORE DATA envelopes, sent on a special channel |
| S_SM-DP+ | Key Maker | Bound Profile Packages, certificate chains, authentication challenges |
| S_SM-DS | Post Office | Event records for discovery testing |
| S_MNO | Mobile company | Over-the-air commands for ES6 testing |
The chip uses a clever two-channel system, like a hotel with a front desk and a VIP entrance:
This separation means the profile management commands can’t accidentally interfere with normal phone operation: and vice versa.
Every test case follows the same recipe:
SW=0x9000 means success!)The test scripts use a three-tier notation system:
#CONSTANTS : Fixed values like #ISD_R_AID (the chip manager’s ID)<VARIABLES> : Dynamic values like <EUICC_CHALLENGE> (a fresh random number)#IUT_SETTINGS : Vendor-specific details like #IUT_MEP_LSI_OPTIONSBefore testing begins, the chip must arrive in a carefully prepared state:
This means every test starts from the same known point: like resetting a video game to level 1 before each new player tries.
For MEP (Multiple Enabled Profiles) testing, the Device Simulator has to support two different ways of telling the chip “now talk on this line” : either through MANAGE LSI commands or through a special byte in the T=1 protocol. The chip maker declares which method their chip uses, and the test adapts!
Kid-friendly version of GSMA SGP.23-1, Section 3, Annexes A, E, F, G, J